P65 Nanopositioning Stage Applied to Nano-metrology
Characteristics
Applications
Nano-metrology/measurement, laser interferometry, nano-lithography, scanning microscopy, nano-positioning, nano-manipulation technology, etc.
Technical Data
型号 |
P65.XY200Z50S/K |
Model |
X、Y、Z |
Nominal travel range
(0~120V) |
XY160μm、Z40μm |
Travel range(0~150V) |
XY200μm、Z50μm |
Sensor |
SGS/- |
Resolution |
XY3nm、Z2nm/
XY1nm、Z0.6nm |
Closed-loop Linearity |
XY0.015%F.S.、
Z0.007%F.S./- |
Repeatability |
XY0.017%F.S.、
Z0.006%F.S./- |
Pitch/Yaw/Roll |
<10μrad |
Unloaded resonant frequency |
X260Hz/Y220Hz/Z280Hz |
Resonant frequency@500g |
150Hz |
Closed/open loop unloaded Step time |
100ms@500g/10ms |
Load capacity |
500g |
El. capacitance |
XY13.6μF/Z3.2μF |
Material |
Steel, Al |
Mass(Cable included) |
1.24kg |
Supporting Controller